51 lines
		
	
	
	
		
			2.3 KiB
			
		
	
	
	
		
			C
		
	
	
	
	
	
		
		
			
		
	
	
			51 lines
		
	
	
	
		
			2.3 KiB
			
		
	
	
	
		
			C
		
	
	
	
	
	
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								/* $Id: estate.h,v 1.1 2001/03/28 10:56:34 davem Exp $ */
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								#ifndef _SPARC64_ESTATE_H
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								#define _SPARC64_ESTATE_H
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								/* UltraSPARC-III E-cache Error Enable */
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								#define ESTATE_ERROR_FMT	0x0000000000040000 /* Force MTAG ECC		*/
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								#define ESTATE_ERROR_FMESS	0x000000000003c000 /* Forced MTAG ECC val	*/
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								#define ESTATE_ERROR_FMD	0x0000000000002000 /* Force DATA ECC		*/
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								#define ESTATE_ERROR_FDECC	0x0000000000001ff0 /* Forced DATA ECC val	*/
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								#define ESTATE_ERROR_UCEEN	0x0000000000000008 /* See below			*/
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								#define ESTATE_ERROR_NCEEN	0x0000000000000002 /* See below			*/
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								#define ESTATE_ERROR_CEEN	0x0000000000000001 /* See below			*/
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								/* UCEEN enables the fast_ECC_error trap for: 1) software correctable E-cache
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								 * errors 2) uncorrectable E-cache errors.  Such events only occur on reads
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								 * of the E-cache by the local processor for: 1) data loads 2) instruction
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								 * fetches 3) atomic operations.  Such events _cannot_ occur for: 1) merge
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								 * 2) writeback 2) copyout.  The AFSR bits associated with these traps are
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								 * UCC and UCU.
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								 */
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								/* NCEEN enables instruction_access_error, data_access_error, and ECC_error traps
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								 * for uncorrectable ECC errors and system errors.
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								 *
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								 * Uncorrectable system bus data error or MTAG ECC error, system bus TimeOUT,
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								 * or system bus BusERR:
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								 * 1) As the result of an instruction fetch, will generate instruction_access_error
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								 * 2) As the result of a load etc. will generate data_access_error.
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								 * 3) As the result of store merge completion, writeback, or copyout will
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								 *    generate a disrupting ECC_error trap.
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								 * 4) As the result of such errors on instruction vector fetch can generate any
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								 *    of the 3 trap types.
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								 *
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								 * The AFSR bits associated with these traps are EMU, EDU, WDU, CPU, IVU, UE,
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								 * BERR, and TO.
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								 */
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								/* CEEN enables the ECC_error trap for hardware corrected ECC errors.  System bus
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								 * reads resulting in a hardware corrected data or MTAG ECC error will generate an
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								 * ECC_error disrupting trap with this bit enabled.
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								 *
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								 * This same trap will also be generated when a hardware corrected ECC error results
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								 * during store merge, writeback, and copyout operations.
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								 */
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								/* In general, if the trap enable bits above are disabled the AFSR bits will still
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								 * log the events even though the trap will not be generated by the processor.
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								 */
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								#endif /* _SPARC64_ESTATE_H */
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