50 lines
		
	
	
	
		
			2.2 KiB
			
		
	
	
	
		
			C
		
	
	
	
	
	
		
		
			
		
	
	
			50 lines
		
	
	
	
		
			2.2 KiB
			
		
	
	
	
		
			C
		
	
	
	
	
	
|   | #ifndef _SPARC64_ESTATE_H
 | ||
|  | #define _SPARC64_ESTATE_H
 | ||
|  | 
 | ||
|  | /* UltraSPARC-III E-cache Error Enable */ | ||
|  | #define ESTATE_ERROR_FMT	0x0000000000040000 /* Force MTAG ECC		*/
 | ||
|  | #define ESTATE_ERROR_FMESS	0x000000000003c000 /* Forced MTAG ECC val	*/
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|  | #define ESTATE_ERROR_FMD	0x0000000000002000 /* Force DATA ECC		*/
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|  | #define ESTATE_ERROR_FDECC	0x0000000000001ff0 /* Forced DATA ECC val	*/
 | ||
|  | #define ESTATE_ERROR_UCEEN	0x0000000000000008 /* See below			*/
 | ||
|  | #define ESTATE_ERROR_NCEEN	0x0000000000000002 /* See below			*/
 | ||
|  | #define ESTATE_ERROR_CEEN	0x0000000000000001 /* See below			*/
 | ||
|  | 
 | ||
|  | /* UCEEN enables the fast_ECC_error trap for: 1) software correctable E-cache
 | ||
|  |  * errors 2) uncorrectable E-cache errors.  Such events only occur on reads | ||
|  |  * of the E-cache by the local processor for: 1) data loads 2) instruction | ||
|  |  * fetches 3) atomic operations.  Such events _cannot_ occur for: 1) merge | ||
|  |  * 2) writeback 2) copyout.  The AFSR bits associated with these traps are | ||
|  |  * UCC and UCU. | ||
|  |  */ | ||
|  | 
 | ||
|  | /* NCEEN enables instruction_access_error, data_access_error, and ECC_error traps
 | ||
|  |  * for uncorrectable ECC errors and system errors. | ||
|  |  * | ||
|  |  * Uncorrectable system bus data error or MTAG ECC error, system bus TimeOUT, | ||
|  |  * or system bus BusERR: | ||
|  |  * 1) As the result of an instruction fetch, will generate instruction_access_error | ||
|  |  * 2) As the result of a load etc. will generate data_access_error. | ||
|  |  * 3) As the result of store merge completion, writeback, or copyout will | ||
|  |  *    generate a disrupting ECC_error trap. | ||
|  |  * 4) As the result of such errors on instruction vector fetch can generate any | ||
|  |  *    of the 3 trap types. | ||
|  |  * | ||
|  |  * The AFSR bits associated with these traps are EMU, EDU, WDU, CPU, IVU, UE, | ||
|  |  * BERR, and TO. | ||
|  |  */ | ||
|  | 
 | ||
|  | /* CEEN enables the ECC_error trap for hardware corrected ECC errors.  System bus
 | ||
|  |  * reads resulting in a hardware corrected data or MTAG ECC error will generate an | ||
|  |  * ECC_error disrupting trap with this bit enabled. | ||
|  |  * | ||
|  |  * This same trap will also be generated when a hardware corrected ECC error results | ||
|  |  * during store merge, writeback, and copyout operations. | ||
|  |  */ | ||
|  | 
 | ||
|  | /* In general, if the trap enable bits above are disabled the AFSR bits will still
 | ||
|  |  * log the events even though the trap will not be generated by the processor. | ||
|  |  */ | ||
|  | 
 | ||
|  | #endif /* _SPARC64_ESTATE_H */
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